The SE 400 is a discrete wavelength ellipsometer which measures n, k and film thickness.
Ease of use by predefined push botton applications.
Subangstrom precision for thin films.
No reference sample needed.



  • Laser wavelength 632.8 nm
  • 150 mm (z-tilt) stage
  • Goniometer with angles of incidence set in 5º steps
  • Small footprint
  • 1-2 mm spot size


More information here

Ansprechpartner:  Dr. Martin Kind