Ellipsometer
The SE 400 is a discrete wavelength ellipsometer which measures n, k and film thickness.
Ease of use by predefined push botton applications.
Subangstrom precision for thin films.
No reference sample needed.
Specifications
- Laser wavelength 632.8 nm
- 150 mm (z-tilt) stage
- Goniometer with angles of incidence set in 5º steps
- Small footprint
- 1-2 mm spot size
More information here
